07. Instruments, apparatus, components, and techniques common to several
branches of physics and astronomy (see also each subdiscipline for
specialized instrumentation and techniques)
07.05.-t Computers in experimental physics
07.05.Bx Computer systems: hardware, operating systems, computer languages,
and utilities
07.05.Dz Control systems
07.05.Fb Design of experiments
07.05.Hd Data acquisition: hardware and software
07.05.Kf Data analysis: algorithms and implementation; data management
07.05.Mh Neural networks, fuzzy logic, artificial intelligence
07.05.Pj Image processing: (see also 42.30.V in optics)
07.05.Rm Data presentation and visualization: algorithms and implementation
07.05.Tp Computer modeling and simulation
07.05.Wr Computer interfaces
07.05.Ys Other topics in computers in experimental physics
07.07.-a General equipment and techniques
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote
sensing
07.07.Hj Display and recording equipment, oscilloscopes, TV cameras, etc.
07.07.Mp Transducers
07.07.Tw Servo and control equipment; robots
07.07.Vx Hygrometers
07.07.Yz Other equipment and techniques
07.10.-h Mechanical instruments, equipment, and techniques
07.10.Cm Micromechanical devices and systems: (see also 85.42 Nanotechnology)
07.10.Fq Vibration isolation
07.10.Lw Balance systems, tensile machines, etc.
07.10.Pz Instruments for strain, force, and torque
07.10.Yg Other mechanical instruments, equipment, and techniques (including
pendulum, gyroscopes, centrifuges, etc.)
07.20.-n Thermal instruments, apparatus, and techniques
07.20.Dt Thermometry
07.20.Fw Calorimetry
07.20.Hy Furnaces; heaters
07.20.Ka High-temperature techniques and instrumentation; pyrometry
07.20.Mc Cryogenics, refrigerators; low-temperature techniques
07.20.Pe Heat engines; heat pumps
07.20.Ym Other thermal instruments and techniques
07.30.-t Vacuum apparatus and techniques (see also 47.45 Rarefied gas
dynamics)
07.30.Bx Degasification, residual gas
07.30.Cy Vacuum pumps
07.30.Dz Vacuum gauges
07.30.Hd Vacuum testing methods; leak detectors
07.30.Kf Vacuum chambers, auxiliary apparatus, and materials
07.35.+k High-pressure apparatus and techniques; shock tubes; diamond anvil
cells
07.50.-e Electrical and electronic components, instruments, and techniques
07.50.Ek Circuits and circuit components: (see also 85.20--in electrical and
magnetic devices)
07.50.Hp Electrical noise and shielding, interference
07.50.Ls Electrometers
07.50.Qx Signal processing electronics
07.50.Yd Other electrical and electronic components, instruments, and
techniques
07.55.-w Magnetic components, instruments and techniques
07.55.Db Generation of magnetic fields; magnets: (see also 85.70.N--in
magnetic devices)
07.55.Ge Magnetometers for magnetic field measurements
07.55.Jg Magnetometers for susceptibility, magnetic moment, and magnetization
measurements
07.55.Nk Magnetic shielding in instruments
07.55.Yv Other magnetic instruments and techniques
07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments,
equipment and techniques (for infrared and radio telescopes, see
95.55)
07.57.Hm Infrared, submillimeter wave, microwave, and radiowave sources
07.57.Kp Bolometer; infrared, submillimeter wave, microwave, and radiowave
receivers and detectors (see also 85.60.G Photodetectors and
infrared detectors)
07.57.Pt Submillimeter wave, microwave and radiowave spectrometers; magnetic
resonance spectrometers, auxiliary equipment, and techniques
07.57.Ty Infrared spectrometers, auxiliary equipment, and techniques
07.57.Yb Other infrared, submillimeter wave, microwave, and radiowave
instruments, equipment, and techniques
07.60.-j Optical instruments, equipment, and techniques
07.60.Dq Photometers, radiometers, and colorimeters
07.60.Fs Polarimeters and ellipsometers
07.60.Hv Refractometers and reflectometers
07.60.Ly Interferometers
07.60.Pb Conventional optical microscopes: (for near-field scanning optical
microscopes, see 07.79.B)
07.60.Rd Visible and ultraviolet spectrometers
07.60.Vg Fiber-optic instruments (see also 42.81 Fiber optics)
07.60.Yi Other optical instruments, equipment and techniques
07.64.+z Acoustic instruments, equipment, and techniques: (see also Acoustic
Appendix)
07.68.+m Photography, photographic instruments and techniques; xerography
07.75.+h Mass spectrometers and related techniques
07.77.-n Atomic, molecular, and charged-particle sources and detectors
07.77.Gx Atomic and molecular beam sources and detectors
07.77.Ka Charged-particle beam sources and detectors
07.78.+s Electron, positron, and ion microscopes, electron diffractometers,
and related techniques
07.79.-v Scanning probe microscopes: components and techniques
07.79.Cz Scanning tunneling microscopes
07.79.Fc Near-field scanning optical microscopes
07.79.Lh Atomic force microscopes
07.79.Pk Magnetic force microscopes
07.79.Sp Friction force microscopes
07.81.+a Electron, ion spectrometers, and related techniques
07.85.-m X- and gamma-ray instruments and techniques (for x- and gamma-ray
telescopes, see 95.55.K)
07.85.Fv X- and gamma-ray sources, mirrors, gratings, and detectors
07.85.Jy Diffractometers
07.85.Nc X- and gamma-ray spectrometers
07.85.Qe Synchrotron radiation instrumentation
07.85.Yk Other x-ray and gamma-ray instruments and techniques
07.87.+v Spaceborne and space research instruments, apparatus, and components
(satellites, space vehicles, etc.)
07.88.+y Instruments for environmental pollution measurements
07.89.+b Environmental effects on instruments (e.g., radiation and pollution
effects)
07.90.+c Other topics in instruments, apparatus, components, and techniques
common to several branches of physics and astronomy